Weijers H.W., Member, IEEE, Markiewicz W.D., Voran A.J., Gundlach S.R., Sheppard W.R., Jarvis B., Johnson Z.L., Noyes P.D., Lu J., Kandel H., Bai H., Gavrilin A.V., Viouchkov Y.L., Larbalestier D.C., Abraimov D.V.
Ключевые слова: HTS, REBCO, coated conductors, coils insert, quench protection, coils pancake, design parameters, prototype, test results, hybrid systems
Selvamanickam V., Xu A., Liu Y., Jaroszynski J., Abraimov D., Khatri N., Delgado L., Larbalestier F.K.
Ключевые слова: HTS, YBCO, REBCO, coated conductors, critical caracteristics, temperature dependence, critical current, coils, thermal conductivity, quench protection, stabilizing layers, heat losses, heat loads, stability, thermal runaway, thickness dependence, hot spots, quench detection, experimental results, presentation
Ключевые слова: HTS, coated conductors, angular dependence, ac losses, high field tests, YBCO, torque, magnetization curves, experimental results, high field magnets
Haugan T.J., Polyanskii A.A., Miller G.E., Stauffer T.C., Lu X.F., Abraimov D., Goodrich L.F., van der Laan D.C., Noyes P.D., Douglas J.F., Clickner J.F., Larbalestier A.A., Weijers P.D.
Ключевые слова: HTS, coated conductors, YBCO, helical winding, cables, mechanical properties, strain effects, critical caracteristics, critical current, REBCO, dc performance, power transmission lines, current-voltage characteristics, model small-scale, test long-term operation, pinning, angular dependence, magnetic field dependence, MOCVD process, IBAD process, PLD process, comparison, anisotropy, presentation, power equipment
Larbalestier D.C., Semerad R., Bauer M., Polyanskii A.A., Abraimov D., van der Laan D.C., Douglas J.F.
Polyanskii A., Braccini V., Larbalestier D., Trociewitz U.P., Noyes P., Jaroszynski J., Abraimov D., Lu J., Viouchkov Y., Hannion M., DALBAN-CANASSY M., Hilton D., Kandel H., Santos M., Weijers H., Whittington A.
Ключевые слова: magnets, hybrid systems, HTS, REBCO, coated conductors, coils solenoidal, coils insert, quench current, fabrication
Ferdeghini C., Larbalestier D.C., Lee S., Sales B.C., Polyanskii A., Gurevich A., Tarantini C., Putti M., Eom C.B., Palenzona A., Pallecchi I., Jiang J., Yamamoto A., Jia Y., Wen H.H., Kametani F., Tropeano M., Jaroszynski J., Abraimov D., Bellingeri E., DWeiss J., EHellstrom E., Jin R., Sefat S.A., McGuire M.A., Mandrus D., Cheng P.
Ключевые слова: funding, plans, collaborations, HTS, YBCO, coated conductors, MOD process, RABITS process, long conductors, pinning, microstructure, thickness dependence, presentation
Ключевые слова: funding, plans, collaborations, HTS, YBCO, current limiting characteristics, coated conductors, MOD process, RABITS process, pinning, defects, grain boundaries, power equipment, presentation
Ключевые слова: presentation, HTS, YBCO, coated conductors, current limiting characteristics, critical caracteristics, critical current density, grain boundaries, buffer layers, crack formation, microstructure, magnetic properties, irreversibility fields, angular dependence, MOCVD process, IBAD process, doping effect, Jc/B curves, pinning, defects, stacking fault, anisotropy, pinning force, experimental results
Ferdeghini C., Larbalestier D.C., Lee S., Sales B.C., Polyanskii A., Gurevich A., Tarantini C., Putti M., Eom C.B., Palenzona A., Pallecchi I., Hellstrom E.E., Jiang J., Yamamoto A., Jia Y., Wen H.H., Kametani F., Tropeano M., Jaroszynski J., Abraimov D., Bellingeri E., Jin R., McGuire M.A., Mandrus D., Cheng P., Cimberle M.R., Weiss J.D., Sefat A.S.
Ключевые слова: presentation, HTS, coated conductors, pinning centers, fabrication, MOD process, fluorine-free process, films thick, substrate SrTiO3, RABITS process, YBCO, critical caracteristics, Jc/B curves, resistance, critical temperature, pinning force, critical current density, angular dependence, thickness dependence, grain boundaries, microstructure, comparison, PLD process, MOCVD process, IBAD process, TFA-MOD process, irreversibility fields, experimental results
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, RABITS process, buffer layers, fabrication, grain alignment, MOD process, ex-situ process, microstructure
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.